• DocumentCode
    2110017
  • Title

    Ultra-low-power CMOS technologies

  • Author

    Schrom, G. ; Selberherr, S.

  • Author_Institution
    Inst. for Microelectron., Tech. Univ. Vienna, Austria
  • Volume
    1
  • fYear
    1996
  • fDate
    9-12 Oct 1996
  • Firstpage
    237
  • Abstract
    The fast growing portable-electronics market as well as thermal dissipation, reliability, and scalability issues have launched a massive trend towards low-power and low-voltage technologies. This has lead to a new, reduced standard digital CMOS supply voltage of 3.3 V reducing the power consumption by 70%. However, the power consumption can still be cut down substantially by reducing the supply and threshold voltages much further without compromising systems performance. A loss in device speed can be compensated on the systems level by appropriate parallel architectures. Based on this concept of ultra-low-power CMOS technologies we explore the lower limits of CMOS supply voltage and switching energy for a variety of circuit classes analytically and numerically. Ultra-low-power (ULP) process and device design, device modeling, performance evaluation, and the specific problems associated with ULP mixed-analog-digital technologies are discussed
  • Keywords
    CMOS integrated circuits; integrated circuit technology; mixed analogue-digital integrated circuits; 3.3 V; ULP mixed-analog-digital technology; low-voltage technology; parallel architecture; portable electronics; power consumption; reliability; scalability; supply voltage; switching energy; thermal dissipation; threshold voltage; ultra-low-power CMOS technology; CMOS technology; Circuit analysis; Energy consumption; Parallel architectures; Process design; Scalability; Semiconductor device modeling; Switching circuits; System performance; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 1996., International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-3223-7
  • Type

    conf

  • DOI
    10.1109/SMICND.1996.557352
  • Filename
    557352