• DocumentCode
    2110357
  • Title

    Challenges to overcurrent protection devices under line-line faults in solar photovoltaic arrays

  • Author

    Zhao, Ye ; Lehman, Brad ; De Palma, Jean-François ; Mosesian, Jerry ; Lyons, Robert

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
  • fYear
    2011
  • fDate
    17-22 Sept. 2011
  • Firstpage
    20
  • Lastpage
    27
  • Abstract
    Solar photovoltaic (PV) arrays behave distinctively from conventional power sources so that they need special consideration in fault analysis and protection. The faults inside PV arrays usually cause overcurrent that may damage PV components. This paper focuses on the challenges to overcurrent protection devices (OCPDs) in a PV array under two types of unique fault scenarios. One is a line-line fault that occurs under low irradiance conditions. In this circumstance, the fault current may not be large enough to trip the OCPDs in the PV array, even when high irradiance occurs later in the day. The other fault scenario is that when PV blocking diodes are used in the PV array, the reverse current may be greatly limited. However, OCPDs might not detect the reverse current properly. In both fault scenarios, the fault may not be cleared successfully by conventional OCPDs. Therefore, faults may remain undetected, which could lead to reduced system efficiency, reduced system reliability, and even unexpected safety hazards.
  • Keywords
    hazards; overcurrent protection; photovoltaic power systems; power generation faults; power generation protection; power generation reliability; safety; solar cell arrays; PV blocking diodes; PV systems; analysis; fault current; line-line faults; overcurrent protection devices; power sources; safety hazards; solar photovoltaic arrays; system reliability; Circuit faults; Clouds; Fault currents; Fuses; Hazards; Inverters; Power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2011 IEEE
  • Conference_Location
    Phoenix, AZ
  • Print_ISBN
    978-1-4577-0542-7
  • Type

    conf

  • DOI
    10.1109/ECCE.2011.6063744
  • Filename
    6063744