• DocumentCode
    2110368
  • Title

    A Pattern based Model Evolution Approach

  • Author

    Kim, Soon-Kyeong ; Carrington, David

  • Author_Institution
    Sch. of Inf. Technol. & Electr. Eng., Univ. of Queensland, St. Lucia, QLD
  • fYear
    2006
  • fDate
    6-8 Dec. 2006
  • Firstpage
    217
  • Lastpage
    224
  • Abstract
    In this paper, we present a framework for pattern-based model evolution approaches in the MDA context. In the framework, users define patterns using a pattern modeling language that is designed to describe software design patterns, and they can use the patterns as rules to evolve their model. In the framework, design model evolution takes place via two steps. The first step is a binding process of selecting a pattern and defining where and how to apply the pattern in the model. The second step is an automatic model transformation that actually evolves the model according to the binding information and the pattern rule. The pattern modeling language is defined in terms of a MOF-based role metamodel, and implemented using an existing modeling framework, EMF, and incorporated as a plugin to the Eclipse modeling environment. The model evolution process is also implemented as an Eclipse plugin. With these two plugins, we provide an integrated framework where defining and validating patterns, and model evolution based on patterns can take place in a single modeling environment.
  • Keywords
    object-oriented programming; software architecture; Eclipse modeling environment; MDA context; MOF-based role metamodel; existing modeling framework; model driven approaches; pattern modeling language; pattern-based model evolution; software design patterns; Asia; Australia; Context modeling; Information technology; Software design; Software engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering Conference, 2006. APSEC 2006. 13th Asia Pacific
  • Conference_Location
    Kanpur
  • ISSN
    1530-1362
  • Print_ISBN
    0-7695-2685-3
  • Type

    conf

  • DOI
    10.1109/APSEC.2006.8
  • Filename
    4137421