• DocumentCode
    2110413
  • Title

    A High-Speed GCD Chip: A Case Study in Asynchronous Design

  • Author

    Gill, Gennette ; Hansen, John ; Agiwal, Ankur ; Vicci, Leandra ; Singh, Montek

  • Author_Institution
    Univ. of North Carolina at Chapel Hill, Chapel Hill, NC
  • fYear
    2009
  • fDate
    13-15 May 2009
  • Firstpage
    205
  • Lastpage
    210
  • Abstract
    This paper presents the design of a greatest common divisor (GCD) chip as a case study in asynchronous or clockless design. The design uses fine-grain asynchronous pipelining to achieve fairly high performance. At the same time, the use of robust asynchronous handshaking in lieu of clocking allows the design to gracefully adapt its operation to voltage and temperature variations, without the need for clock recalibration. The design was fabricated in a 0.13mum CMOS process, using standard cells and with full testability support. Resulting chips were evaluated for performance and robustness, using a large set of test vectors for good fault coverage. Under nominal operating conditions (1.5 V and 27degC), the fabricated parts were able to deliver up to 8 giga GCD algorithmic iterations per second (equivalent to 1 GHz clock speed). Moreover, they were functionally correct across a wide range of voltages (0.5 V to 4 V) and temperatures (-45degC to 150degC). This case study bolsters our confidence in the potential of aynchronous design techniques to help produce reliable ASICS that are fast, testable, and that operate under a wide range of conditions.
  • Keywords
    CMOS logic circuits; application specific integrated circuits; asynchronous circuits; digital arithmetic; logic design; CMOS process; application specific integrated circuits; asynchronous design; asynchronous handshaking; clock recalibration; fine-grain asynchronous pipelining; greatest common divisor chip; size 0.13 mum; temperature -45 degC to 150 degC; voltage 0.5 V to 4 V; Application specific integrated circuits; CMOS process; Clocks; Iterative algorithms; Pipeline processing; Robustness; Temperature distribution; Testing; Very large scale integration; Voltage; Asynchronous; GCD; case study; clockless; pipelining;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI, 2009. ISVLSI '09. IEEE Computer Society Annual Symposium on
  • Conference_Location
    Tampa, FL
  • Print_ISBN
    978-1-4244-4408-3
  • Electronic_ISBN
    978-0-7695-3684-2
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2009.47
  • Filename
    5076408