• DocumentCode
    2110916
  • Title

    Two-dimensional Modeling Of Self-aligned Silicide Process With A General-purpose Process Simulater OPUS

  • Author

    Kai, K. ; Kuroda, S. ; Nishi, K.

  • Author_Institution
    OKI Electric Industry Co., Ltd.
  • fYear
    1993
  • fDate
    14-15 May 1993
  • Firstpage
    66
  • Lastpage
    67
  • Keywords
    Analytical models; Electric resistance; Equations; MOSFET circuits; Research and development; Silicides; Silicon; Simulated annealing; Surfaces; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
  • Print_ISBN
    0-7803-1338-0
  • Type

    conf

  • DOI
    10.1109/VPAD.1993.724725
  • Filename
    724725