Title :
EEG EPs analysis of magnetic stimulation on acupoint of Shenmen(HT7)
Author :
Geng Yuehua ; Zhang Xin
Author_Institution :
Province-Minist. Joint Key Lab. of Electromagn. Field & Electr. Apparatus Reliability, Hebei Univ. of Technol., Tianjin, China
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
Acupuncture is a useful irritation therapy clinically. Acupuncture at acupoints is proved to have specific function on human body. Magnetic stimulation is a new kind of stimulating technique of non-invasive, painless and effective. The effect of magnetic stimulation on acupoint is a new subject in recent years. In this paper, the electroencephalogram (EEG) evoked potentials (EPs) of magnetic stimulation by stimulating the acupoint of Shenmen(HT7) are studied. The experiments are divided into four groups: quiet, acupoint stimulation, mock stimulation and mock point stimulation. The EEG EPs are collected and an obvious P150 component is obtained. The amplitudes of P150s are analyzed and compared. The P150s are localized in brain by dipole model and the coronal, sagittal and axial plans are painted and observed. The results show that acupoint stimulation on acupoint of Shenmen(HT7) can evoke stronger nerve activity of somatosensory than stimulation on common surface. The dipole source of acupoint stimulation and common surface stimulation are both focused on the cingulated gyrus which related to somatosensory.
Keywords :
bioelectric potentials; biomagnetism; electroencephalography; neurophysiology; EEG evoked potentials; Shenmen; acupoint stimulation; acupuncture; brain; cingulated gyrus; dipole model; irritation therapy; magnetic stimulation; mock point stimulation; mock stimulation; nerve activity; Educational institutions; Electric potential; Electrodes; Electroencephalography; Magnetic stimulation; Principal component analysis; Scalp; Acupuncture Points; Electroencephalography; Evoked Potentials; Humans; Magnetics; Principal Component Analysis;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6347299