• DocumentCode
    2112036
  • Title

    A new approach for automated characterization of high speed serial interfaces of SoC

  • Author

    Fefer, Y. ; Rysin, A. ; Mantel, O.

  • Author_Institution
    Freescale Semicond. Israel Ltd., Herzelia
  • fYear
    2008
  • fDate
    13-14 May 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    The testing approach described in the paper proposes to reduce the time required for HSSI characterization by testing the devices according to specially developed PHY specifications, instead of direct testing of all electrical parameters required by the supported standards, and introducing an automated testing setup, based on an automated active probing solution.
  • Keywords
    semiconductor device testing; system-on-chip; PHY specifications; SoC; automated active probing solution; automated characterization; automated testing setup; electrical parameters; high speed serial interfaces; Automatic testing; Circuit testing; Distortion; Integrated circuit interconnections; Physical layer; Power system interconnection; Protocols; Standards development; Test equipment; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwaves, Communications, Antennas and Electronic Systems, 2008. COMCAS 2008. IEEE International Conference on
  • Conference_Location
    Tel-Aviv
  • Print_ISBN
    978-1-4244-2097-1
  • Electronic_ISBN
    978-1-4244-2098-8
  • Type

    conf

  • DOI
    10.1109/COMCAS.2008.4562825
  • Filename
    4562825
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2112036