Title :
Hybrid approach for RF MEMS devices
Author :
Aharon, O. ; Gal, L. ; Nemirovsky, Y.
Author_Institution :
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa
Abstract :
This work presents the RF design considerations of electro-mechanical MEMS structures realized by the hybrid approach. Modeling of the MEMS devices capacitance in up state is different than for surface micromachined devices, due to significant fringing fields. RF MEMS demonstrators as switch and inductor have been modeled, simulated and RF characterized. The fabrication of the hybrid devices has been performed using bulk micromachining of an SOI wafer, followed by a vertical integration with a GaAs and InP circuit substrates.
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; micromachining; micromechanical devices; silicon-on-insulator; GaAs; InP; RF MEMS devices; RF design considerations; SOI wafer; bulk micromachining; electro-mechanical MEMS structures; fringing fields; hybrid approach; hybrid devices fabrication; surface micromachined devices; vertical integration; Capacitance; Circuit simulation; Fabrication; Inductors; Microelectromechanical devices; Micromechanical devices; Radio frequency; Radiofrequency microelectromechanical systems; Semiconductor device modeling; Switches;
Conference_Titel :
Microwaves, Communications, Antennas and Electronic Systems, 2008. COMCAS 2008. IEEE International Conference on
Conference_Location :
Tel-Aviv
Print_ISBN :
978-1-4244-2097-1
Electronic_ISBN :
978-1-4244-2098-8
DOI :
10.1109/COMCAS.2008.4562834