Title :
A comprehensive flow for transfer of designs between technologies
Author :
Sheinman, B. ; Ramm, D. ; Nachmany, D.
Author_Institution :
IBM Res. Labs., Haifa
Abstract :
In this work we present an approach based on device level parameters where the biasing of the circuits is predetermined from the source design properties thereby ensuring biasing conditions of the remapped circuit. This approach allows the designer to have complete control over the electrical properties of the design enabling fast and accurate convergence to design target requirements. The computational complexity is linear with design size and is therefore suited for large circuits.
Keywords :
computational complexity; network synthesis; biasing conditions; computational complexity; device level parameters; electrical properties; large circuits; remapped circuit; source design properties; Analog circuits; Circuit optimization; Circuit topology; Computational complexity; Digital circuits; Geometry; Low voltage; Process design; Productivity; Robustness;
Conference_Titel :
Microwaves, Communications, Antennas and Electronic Systems, 2008. COMCAS 2008. IEEE International Conference on
Conference_Location :
Tel-Aviv
Print_ISBN :
978-1-4244-2097-1
Electronic_ISBN :
978-1-4244-2098-8
DOI :
10.1109/COMCAS.2008.4562837
