Title :
High temperature packaging of 50 kW three-phase SiC power module
Author :
Xu, Fan ; Jiang, Dong ; Wang, Jing ; Wang, Fred ; Tolbert, Leon M. ; Han, Timothy Junghee ; Nagashima, Jim ; Kim, Sung Joon
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
fDate :
May 30 2011-June 3 2011
Abstract :
Research on silicon carbide (SiC) power electronics has shown their advantages in high temperature and high efficiency applications. This paper presents a SiC JFET based, 200°C, 50 kW three-phase inverter module and evaluates its electrical performance. With 1200 V, 100 A rating of the module, each switching element is composed of four paralleled SiC JFETs (1200 V/25 A each) and two anti parallel SiC Shottky Barrier Diodes (SBDs). The substrate layout inside the module is designed to reduce package parasitics. Then, experimental static characteristics of the module are obtained over a wide range of temperature, and low on-state resistance is shown up to 200°C. A gate driver, with different turn-on, turn-off gate resistances and RCD network, is designed to optimize the switching performances. The module is verified to have low power loss, fast switching characteristics at 650 V dc bus voltage, 60 A drain current, in both simulation and experiments. Finally, switching time and losses, obtained from simulation and experiment, are compared.
Keywords :
Schottky diodes; invertors; junction gate field effect transistors; power semiconductor devices; semiconductor device packaging; silicon compounds; wide band gap semiconductors; JFET; RCD network; SBD; Shottky barrier diode; SiC; current 100 A; current 60 A; dc bus voltage; high temperature packaging; package parasitics reduction; power 50 kW; power electronics; temperature 200 degC; three-phase power module; voltage 1200 V; voltage 250 V; JFETs; Logic gates; Multichip modules; Resistance; Silicon carbide; Switches; Temperature; High Power; High Temperature; Packaging; SiC JFET Power Module;
Conference_Titel :
Power Electronics and ECCE Asia (ICPE & ECCE), 2011 IEEE 8th International Conference on
Conference_Location :
Jeju
Print_ISBN :
978-1-61284-958-4
Electronic_ISBN :
2150-6078
DOI :
10.1109/ICPE.2011.5944718