Title :
Numerical Examination and Experimental Verification of Thermal Performance of Board-level QFP with Unattached Drop-in Heat Spreader
Author :
Lai, Yi-Shao ; Wang, Tong Hong ; Lee, Chang-Chi ; Chen, Hsuan-Yu
Author_Institution :
Stress-Reliability Lab., Adv. Semicond. Eng. Inc., Kaohsiung
Abstract :
In this paper, we evaluate the board-level thermal performance of QFP with an unattached drop-in heat spreader numerically and experimentally. The die is given a power dissipation and induced thermomechanical deformations and the gap distribution on the unattached interface are calculated through the three-dimensional thermal-mechanical coupling analysis incorporated with the contact methodology. The measured junction to ambient thermal resistance is used to validate the numerical results, which involve different interfacial thermal transfer conditions
Keywords :
integrated circuit packaging; thermal analysis; thermal management (packaging); thermal resistance; 3D thermal-mechanical coupling analysis; board-level thermal performance; drop-in heat spreader; induced thermomechanical deformations; quad flat package; thermal resistance; thermal transfer; Contact resistance; Costs; Electrical resistance measurement; Electronic packaging thermal management; Electronics packaging; Heat engines; Thermal conductivity; Thermal engineering; Thermal resistance; Thermal stresses;
Conference_Titel :
Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on
Conference_Location :
Como
Print_ISBN :
1-4244-0275-1
DOI :
10.1109/ESIME.2006.1643950