DocumentCode :
2114353
Title :
Reliability Analysis of a New Soldering Process For Automotive Power Modules Application
Author :
Mathieu, Rizzi ; Eric, Woirgard ; Stephane, Azzopardi
Author_Institution :
IXL Lab., ENSEIRB CNRS-UMR, Talence
fYear :
2006
fDate :
24-26 April 2006
Firstpage :
1
Lastpage :
4
Abstract :
This paper presents a reliability study of power assemblies based on the correlation of finite element simulations and experimental results. For these power modules, a new process was used to solder bare dice on a copper lead frame with a local heating source. The reliability methodology we are using is based on the evaluation of the strain energy density accumulated in the solder joint during the lifetime of the assembly. The study was also carried out on various types of solder. Two series of simulations have been carried out in parallel. The first series was the simulation of a classical reflow process with a uniform temperature of 300degC in the whole assembly. The second one was the simulation of the new process with localized heating. The comparison of the results of the simulations allowed concluding that this new process does not introduce more strain than a normal process. In order to evaluate the lifetime of the assembly, ageing tests have been carried out on representative test vehicles. By correlation between simulations and ageing tests, we have evaluated the lifetime of the assembly under operation conditions
Keywords :
assembling; automobile industry; finite element analysis; power system reliability; reflow soldering; solders; 300 C; assembly lifetime; automotive power modules; copper lead frame; finite element simulations; local heating source; power assembly; reflow soldering process; reliability analysis; solder joint; strain energy density; Aging; Assembly; Automotive engineering; Capacitive sensors; Copper; Finite element methods; Heating; Life testing; Multichip modules; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on
Conference_Location :
Como
Print_ISBN :
1-4244-0275-1
Type :
conf
DOI :
10.1109/ESIME.2006.1643973
Filename :
1643973
Link To Document :
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