Title :
Flickermeter Design: An Improved Method to evaluate Short term Flicker Severity Index (Pst) using Walsh Hadamard Transform (WHT)
Author :
Ranganathan, Prakash ; Kavasseri, Rajesh
Author_Institution :
Dept. of Electr. Eng., Univ. of North Dakota, Grand Forks, ND, USA
Abstract :
This paper proposes a method to estimate the flicker severity index using the Walsh Hadamard transform (WHT). A weighting filter in the sequency domain is utilized for direct computation of the flicker index. The proposed method is compared with a flicker meter in the frequency domain that uses the fast Fourier transform (FFT). It is seen by numerical simulations that the proposed method yields flicker severity indices within the stipulated range for six test signals prescribed by the IEC. The computational simplicity of the Hadamard transform is explained with respect to floating point operations(flops). complexity of FFT increases as order of N Increases and computational savings of Hadamard transform over FFT is shown with respect to number of floating point operations through the simulations carried in MATLAB and C platforms.
Keywords :
Hadamard transforms; Walsh functions; computational complexity; fast Fourier transforms; FFT; Hadamard transform; MATLAB; Walsh Hadamard transform; and computational savings; fast Fourier transform; flicker severity index; flickermeter design; floating point operations; numerical simulations; sequency domain; short term flicker severity index; Design methodology; Fast Fourier transforms; Filters; Frequency domain analysis; IEEE members; Neodymium; Numerical simulation; State estimation; USA Councils; Voltage fluctuations;
Conference_Titel :
Power and Energy Engineering Conference (APPEEC), 2010 Asia-Pacific
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4812-8
Electronic_ISBN :
978-1-4244-4813-5
DOI :
10.1109/APPEEC.2010.5449276