DocumentCode :
2114533
Title :
An investigation of the I-V relationship of double barrier resonant tunneling diodes in oscillating conditions
Author :
Neculoiu, Dan ; Sztojanov, Lstvan ; Tebeanu, Teodor
Author_Institution :
Univ. Politehnica, Bucharest, Romania
Volume :
2
fYear :
1997
fDate :
7-11 Oct 1997
Firstpage :
345
Abstract :
The measured I-V characteristics of the double barrier resonant tunneling (DBRT) diode is distorted in the negative differential conductance region if the device is unstable. This paper presents a study of the I-V curve of the DBRT diode in oscillating conditions. This task is fulfilled using an accurate large signal model and PSPICE simulations. First, the PSPICE DBRT diode model is presented. Then the circuit model used for nonlinear simulations is described. Based on the simulation results, concluding remarks with regards to DBRT diode behavior are derived
Keywords :
SPICE; negative resistance; resonant tunnelling diodes; semiconductor device models; DBRT diode; I-V characteristics; I-V curve; I-V relationship; PSPICE DBRT diode model; PSPICE simulations; accurate large signal model; circuit model; double barrier resonant tunneling diodes; negative differential conductance region; nonlinear simulations; oscillating conditions; simulation results; Capacitors; Circuit simulation; Diodes; Frequency; Microwave devices; Microwave measurements; Microwave oscillators; Power measurement; Resonant tunneling devices; SPICE;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 1997. CAS '97 Proceedings., 1997 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-3804-9
Type :
conf
DOI :
10.1109/SMICND.1997.651174
Filename :
651174
Link To Document :
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