• DocumentCode
    2114962
  • Title

    Monte Carlo Analysis Of Hot Carrier Effects In Ultra Small Geometry MOSFETs

  • Author

    Fiegna, C. ; Iwai, H. ; Kimura, Tomohiro ; Nakamura, Shigenari ; Sangiorgi, E. ; Ricco, D.

  • Author_Institution
    Toshiba Corporation
  • fYear
    1993
  • fDate
    14-15 May 1993
  • Firstpage
    102
  • Lastpage
    103
  • Keywords
    Computational modeling; Electrons; Geometry; Heating; Hot carrier effects; MOSFETs; Monte Carlo methods; Research and development; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
  • Print_ISBN
    0-7803-1338-0
  • Type

    conf

  • DOI
    10.1109/VPAD.1993.724740
  • Filename
    724740
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2114962