DocumentCode :
2115525
Title :
The loss calculation of RCD snubber with forward and reverse recovery effects considerations
Author :
Cai, Chen ; Xue-jun, Pei ; Yu, Chen ; Yong, Kang
Author_Institution :
Coll. of Electr. & Electron. Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear :
2011
fDate :
May 30 2011-June 3 2011
Firstpage :
3005
Lastpage :
3012
Abstract :
This paper addresses the problem of turn-off and turn-on performances of a RCD snubber circuit in high power inverter that works with insulated gate bipolar transistor (IGBT). The RCD snubber circuit turn-off and turn-on dynamics, forward and reverse recovery effects of the associated freewheeling and snubber diodes, and corresponding snubber losses are analyzed. Voltage impacts occur across the snubber resistor due to the snubber diode´s forward and reverse recovery effects, which bring in additional snubber losses. The turn-on current rising rates have two parts due to the anti-parallel free-wheeling diode (FWD) reverse recovery current that will influence the RCD loss. Moreover, the snubber has the same clamping effect as turn-off due to the anti-parallel FWD´s reverse recovery current. In addition, the proposed analysis was experimentally verified, the snubber loss are presented and discussed in the paper. Moreover, a well-designed temperature measurement is proposed to evaluate the loss.
Keywords :
clamps; insulated gate bipolar transistors; snubbers; temperature measurement; IGBT; RCD snubber circuit; anti-parallel free-wheeling diode; associated freewheeling; clamping effect; forward recovery; high power inverter; insulated gate bipolar transistor; reverse recovery; snubber diodes; snubber resistor; temperature measurement; Capacitors; Clamps; Inductance; Insulated gate bipolar transistors; Inverters; Resistors; Snubbers; Snubber; forward recovery; free-wheeling diode; reverse recovery;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and ECCE Asia (ICPE & ECCE), 2011 IEEE 8th International Conference on
Conference_Location :
Jeju
ISSN :
2150-6078
Print_ISBN :
978-1-61284-958-4
Electronic_ISBN :
2150-6078
Type :
conf
DOI :
10.1109/ICPE.2011.5944806
Filename :
5944806
Link To Document :
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