DocumentCode :
2115580
Title :
An Influence Of Electron-electron Scatterings To Distribution Functions
Author :
Iizuka, T. ; Kato, H. ; Fukuma, M.
Author_Institution :
NEC Corporation
fYear :
1993
fDate :
14-15 May 1993
Firstpage :
106
Lastpage :
107
Keywords :
Acoustic scattering; Distribution functions; Electron mobility; Hot carriers; Impurities; Laboratories; MOSFETs; Microelectronics; National electric code; Phonons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
Print_ISBN :
0-7803-1338-0
Type :
conf
DOI :
10.1109/VPAD.1993.724742
Filename :
724742
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2115580
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