• DocumentCode
    2115586
  • Title

    GaN-based lamb-wave mass-sensors on silicon substrates

  • Author

    Lee, Chi Ming ; Wong, Ka Ming ; Chen, Peng ; Lau, Kei May

  • Author_Institution
    Electron. & Comput. Eng. Dept., Hong Kong Univ. of Sci. & Technol. (HKUST), Kowloon, China
  • fYear
    2010
  • fDate
    1-4 Nov. 2010
  • Firstpage
    2008
  • Lastpage
    2011
  • Abstract
    Lamb-wave mass-sensors were fabricated with MOCVD-grown GaN-based thin films on silicon substrates. Crystalline GaN provides an alternative choice of material for fabricating Lamb-wave sensors. The advantageous properties of this material include high acoustic velocity, high chemical, mechanical and thermal stability, and the potential to integrate with a wide range of GaN-based devices such as high electron mobility transistor (HEMT) circuits, light emitting diodes (LED) and other photonic devices. We successfully developed GaN based Lamb-wave mass-sensors in small size (membrane size of ~1mm × 1mm). The sensors showed good signal strength and mass sensitivity, comparable to other mass-sensors using conventional materials. This novel approach not only allows robust low-cost sensors to be fabricated, but also enables future integration with generic GaN-based devices on the same chip (i.e. lab-on-a-chip).
  • Keywords
    III-V semiconductors; MOCVD; gallium compounds; silicon; substrates; surface acoustic wave sensors; wide band gap semiconductors; GaN; Lamb-wave mass-sensors; MOCVD; Si; silicon substrates; thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2010 IEEE
  • Conference_Location
    Kona, HI
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-8170-5
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2010.5689946
  • Filename
    5689946