• DocumentCode
    2115833
  • Title

    Autofocusing Image System of CD-SEM

  • Author

    Liu, Wei ; Shen, Jin ; Tan, Boxue

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Shandong Univ. of Technol., Zibo, China
  • fYear
    2009
  • fDate
    17-19 Oct. 2009
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In order to realize auto focus during CD-SEM imaging process, the structure of image and scanning model is explained. The principle and the performance of image sharpness evaluation function, such as pixel gray variance function, gradient function, gray entropy function and SMD function, are analyzed in this paper. The experiment shows that all listed methods can evaluate the image sharpness correctly. But gray variance function excels in speed and evaluation effect, thus proving to be the ideal image sharpness function for CD-SEM auto focus.
  • Keywords
    image processing; scanning electron microscopy; CD-SEM imaging process; autofocusing image system; critical dimension-SEM; gray variance function; image sharpness evaluation function; scanning electron microscopy; Atomic force microscopy; Electron beams; Focusing; Image analysis; Integrated circuit measurements; Integrated circuit modeling; Lenses; Optical microscopy; Pixel; Scanning electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
  • Conference_Location
    Tianjin
  • Print_ISBN
    978-1-4244-4129-7
  • Electronic_ISBN
    978-1-4244-4131-0
  • Type

    conf

  • DOI
    10.1109/CISP.2009.5302635
  • Filename
    5302635