DocumentCode
2115833
Title
Autofocusing Image System of CD-SEM
Author
Liu, Wei ; Shen, Jin ; Tan, Boxue
Author_Institution
Sch. of Electr. & Electron. Eng., Shandong Univ. of Technol., Zibo, China
fYear
2009
fDate
17-19 Oct. 2009
Firstpage
1
Lastpage
3
Abstract
In order to realize auto focus during CD-SEM imaging process, the structure of image and scanning model is explained. The principle and the performance of image sharpness evaluation function, such as pixel gray variance function, gradient function, gray entropy function and SMD function, are analyzed in this paper. The experiment shows that all listed methods can evaluate the image sharpness correctly. But gray variance function excels in speed and evaluation effect, thus proving to be the ideal image sharpness function for CD-SEM auto focus.
Keywords
image processing; scanning electron microscopy; CD-SEM imaging process; autofocusing image system; critical dimension-SEM; gray variance function; image sharpness evaluation function; scanning electron microscopy; Atomic force microscopy; Electron beams; Focusing; Image analysis; Integrated circuit measurements; Integrated circuit modeling; Lenses; Optical microscopy; Pixel; Scanning electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
Conference_Location
Tianjin
Print_ISBN
978-1-4244-4129-7
Electronic_ISBN
978-1-4244-4131-0
Type
conf
DOI
10.1109/CISP.2009.5302635
Filename
5302635
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