Title :
Autofocusing Image System of CD-SEM
Author :
Liu, Wei ; Shen, Jin ; Tan, Boxue
Author_Institution :
Sch. of Electr. & Electron. Eng., Shandong Univ. of Technol., Zibo, China
Abstract :
In order to realize auto focus during CD-SEM imaging process, the structure of image and scanning model is explained. The principle and the performance of image sharpness evaluation function, such as pixel gray variance function, gradient function, gray entropy function and SMD function, are analyzed in this paper. The experiment shows that all listed methods can evaluate the image sharpness correctly. But gray variance function excels in speed and evaluation effect, thus proving to be the ideal image sharpness function for CD-SEM auto focus.
Keywords :
image processing; scanning electron microscopy; CD-SEM imaging process; autofocusing image system; critical dimension-SEM; gray variance function; image sharpness evaluation function; scanning electron microscopy; Atomic force microscopy; Electron beams; Focusing; Image analysis; Integrated circuit measurements; Integrated circuit modeling; Lenses; Optical microscopy; Pixel; Scanning electron microscopy;
Conference_Titel :
Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
Conference_Location :
Tianjin
Print_ISBN :
978-1-4244-4129-7
Electronic_ISBN :
978-1-4244-4131-0
DOI :
10.1109/CISP.2009.5302635