DocumentCode
2115895
Title
Sequentially-Coupled Finite Element Transient Analysis with Hygroscopic Swelling
Author
Zhou, Jiang
Author_Institution
Dept. of Mech. Eng., Lamar Univ., Beaumont, TX
fYear
2006
fDate
24-26 April 2006
Firstpage
1
Lastpage
6
Abstract
The characterization of the hygroscopic property for the packaging materials presents unique challenges, which are not adequately addressed in current methods. One of those challenges is the impact of non-uniform moisture distribution across the specimen. Our recent studies have shown that the current averaged approach might overestimate the coefficient of hygroscopic swelling as much as 250%. In our previous analysis, however, the hygroscopic stress induced deformation has not been taken into consideration. As a matter of fact, due to non-uniform moisture distribution during the test, the total measured deformation includes the hygroscopic swelling itself, and the hygroscopic stress induced deformation. In this paper, a comprehensive study is performed on the impacts of non-uniform moisture distribution and the effect of hygroscopic stress by using sequentially coupled moisture diffusion and hygroscopic stress modeling approach. The results show that the hygroscopic stress induced displacement is relatively small, although the elastic strain caused by the hygroscopic stress accounts for about one third of the total strain. The results in our previous study are proved to be acceptably accurate, even through the hygroscopic stress induced elastic deformation has been neglected
Keywords
elastic deformation; electronics packaging; finite element analysis; stress effects; swelling; elastic strain; finite element transient analysis; hygroscopic stress effect; hygroscopic stress induced displacement; hygroscopic stress modeling; hygroscopic swelling; nonuniform moisture distribution; sequentially coupled moisture diffusion; Capacitive sensors; Electronics packaging; Finite element methods; Inorganic materials; Mechanical engineering; Moisture measurement; Stress measurement; Testing; Thermal stresses; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on
Conference_Location
Como
Print_ISBN
1-4244-0275-1
Type
conf
DOI
10.1109/ESIME.2006.1644028
Filename
1644028
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