DocumentCode :
2116598
Title :
Evolution of Semiconductor Packaging. Present and Future
Author :
Cognetti, Carlo
Author_Institution :
STMicroelectronics, Milan
fYear :
2006
fDate :
24-26 April 2006
Firstpage :
1
Lastpage :
1
Abstract :
Summary form only given. Evolution of semiconductor packaging has taken impressive acceleration, under the pressure of new applications, combining very high volumes, innovation and cost effectiveness. Conventional single chip package completed its cycle, by reaching a die-to-package ratio close to one. And also wire bonding technology is getting close to its physical limits, at about 25-30 micron bonding pad pitch. New 3D interconnection technologies, like system in package (SiP), package on package (PoP) and, package in package (PiP), offer the unique advantage of integrating heterogeneous functions in the three dimensions of the package, which can be in some extent competitive with chip-level integration (system on chip - SoC)
Keywords :
chip scale packaging; lead bonding; system-in-package; system-on-chip; 25 to 30 micron; 3D interconnection; bonding pad pitch; chip-level integration; die-to-package ratio; package in package; package on package; semiconductor packaging; single chip package; system in package; system-on-chip; wire bonding; Acceleration; Bonding; Costs; Manufacturing industries; Semiconductor device packaging; Silicon; Substrates; System-on-a-chip; Technological innovation; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on
Conference_Location :
Como
Print_ISBN :
1-4244-0275-1
Type :
conf
DOI :
10.1109/ESIME.2006.1644056
Filename :
1644056
Link To Document :
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