DocumentCode
2116598
Title
Evolution of Semiconductor Packaging. Present and Future
Author
Cognetti, Carlo
Author_Institution
STMicroelectronics, Milan
fYear
2006
fDate
24-26 April 2006
Firstpage
1
Lastpage
1
Abstract
Summary form only given. Evolution of semiconductor packaging has taken impressive acceleration, under the pressure of new applications, combining very high volumes, innovation and cost effectiveness. Conventional single chip package completed its cycle, by reaching a die-to-package ratio close to one. And also wire bonding technology is getting close to its physical limits, at about 25-30 micron bonding pad pitch. New 3D interconnection technologies, like system in package (SiP), package on package (PoP) and, package in package (PiP), offer the unique advantage of integrating heterogeneous functions in the three dimensions of the package, which can be in some extent competitive with chip-level integration (system on chip - SoC)
Keywords
chip scale packaging; lead bonding; system-in-package; system-on-chip; 25 to 30 micron; 3D interconnection; bonding pad pitch; chip-level integration; die-to-package ratio; package in package; package on package; semiconductor packaging; single chip package; system in package; system-on-chip; wire bonding; Acceleration; Bonding; Costs; Manufacturing industries; Semiconductor device packaging; Silicon; Substrates; System-on-a-chip; Technological innovation; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on
Conference_Location
Como
Print_ISBN
1-4244-0275-1
Type
conf
DOI
10.1109/ESIME.2006.1644056
Filename
1644056
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