• DocumentCode
    2116598
  • Title

    Evolution of Semiconductor Packaging. Present and Future

  • Author

    Cognetti, Carlo

  • Author_Institution
    STMicroelectronics, Milan
  • fYear
    2006
  • fDate
    24-26 April 2006
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. Evolution of semiconductor packaging has taken impressive acceleration, under the pressure of new applications, combining very high volumes, innovation and cost effectiveness. Conventional single chip package completed its cycle, by reaching a die-to-package ratio close to one. And also wire bonding technology is getting close to its physical limits, at about 25-30 micron bonding pad pitch. New 3D interconnection technologies, like system in package (SiP), package on package (PoP) and, package in package (PiP), offer the unique advantage of integrating heterogeneous functions in the three dimensions of the package, which can be in some extent competitive with chip-level integration (system on chip - SoC)
  • Keywords
    chip scale packaging; lead bonding; system-in-package; system-on-chip; 25 to 30 micron; 3D interconnection; bonding pad pitch; chip-level integration; die-to-package ratio; package in package; package on package; semiconductor packaging; single chip package; system in package; system-on-chip; wire bonding; Acceleration; Bonding; Costs; Manufacturing industries; Semiconductor device packaging; Silicon; Substrates; System-on-a-chip; Technological innovation; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on
  • Conference_Location
    Como
  • Print_ISBN
    1-4244-0275-1
  • Type

    conf

  • DOI
    10.1109/ESIME.2006.1644056
  • Filename
    1644056