BIST using Cellular Automata as test pattern generator and response compaction

Author

Gao, Lixin ; Zhang, Yongliang ; Zhao, Jinhong

Author_Institution

Sch. of Inf. Eng., Guangdong Jidian Polytech., Guangzhou, China

fYear

2012

fDate

21-23 April 2012

Firstpage

200

Lastpage

203

Abstract

In the Built-in self-test (BIST), a pseudo-random generator is used to apply test vectors to the circuit under test and a data compactor is used to produce a signature. This paper verifies that a linear hybrid Cellular Automata (CA) as a test pattern generator has a maximum length cycle and better random properties, and such CA as a signature analyzer have the same aliasing properties as linear feedback shift registers.

Keywords

automatic test pattern generation; built-in self test; cellular automata; logic analysers; random number generation; BIST; aliasing property; built-in self test; cellular automata; circuit under test; data compactor; linear feedback shift register; maximum length cycle; pseudorandom generator; response compaction; signature analyzer; test pattern generator; test vector; Automata; Built-in self-test; Circuit faults; Generators; Polynomials; Test pattern generators; Vectors; BIST; aliasing; cellular automata; fault coverage; maximal length cycle; random;

fLanguage

English

Publisher

ieee

Conference_Titel

Consumer Electronics, Communications and Networks (CECNet), 2012 2nd International Conference on

Conference_Location

Yichang

Print_ISBN

978-1-4577-1414-6

Type

conf

DOI

10.1109/CECNet.2012.6201620

Filename

6201620