• DocumentCode
    2116849
  • Title

    Non Gaussian models for hyperspectral algorithm design and assessment

  • Author

    Manolakis, Dimitris ; Marden, David

  • Author_Institution
    Lincoln Lab., MIT, Lexington, MA, USA
  • Volume
    3
  • fYear
    2002
  • fDate
    24-28 June 2002
  • Firstpage
    1664
  • Abstract
    In this paper, we explore the use of elliptically contoured distributions (ECDs) to model the statistical variability of hyperspectral imaging (HSI) data. ECDs have the elliptical symmetry of the multivariate Gaussian distribution and therefore share most of its properties. However, the presence of additional parameters, allows to control the behavior of their tails to match the distribution of the data more accurately than the normal distribution. More specifically, the purpose of our paper is two fold. First, we provide a brief introduction to ECDs and their key properties. Second, we introduce the multivariate EC t-distribution and investigate its capability to accurately describe the joint statistics of HSI data from the HYDICE sensor.
  • Keywords
    geophysical signal processing; geophysical techniques; image processing; multidimensional signal processing; remote sensing; terrain mapping; vegetation mapping; 400 to 2500 nm; EC t-distribution; HSI; HYDICE; IR; algorithm; elliptical symmetry; elliptically contoured distribution; geophysical measurement technique; hyperspectral imaging; hyperspectral remote sensing; image processing; infrared; joint statistics; land surface; multispectral remote sensing; multivariate Gaussian distribution; nonGaussian model; statistical variability; tails; terrain mapping; vegetation mapping; visible; Algorithm design and analysis; Clustering algorithms; Electronic mail; Gaussian distribution; Hyperspectral imaging; Hyperspectral sensors; Laboratories; Probability distribution; Random variables; Statistical distributions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2002. IGARSS '02. 2002 IEEE International
  • Print_ISBN
    0-7803-7536-X
  • Type

    conf

  • DOI
    10.1109/IGARSS.2002.1026214
  • Filename
    1026214