DocumentCode :
2116888
Title :
Flexible zinc oxide thin-film transistors using oxide buffer layers on polyethylene napthalate substrates
Author :
Higaki, T. ; Tachibana, T. ; Kimura, Y. ; Maemoto, T. ; Sasa, S. ; Inoue, M.
Author_Institution :
Nanomater. Microdevices Res. Center, Osaka Inst. of Technol., Osaka, Japan
fYear :
2011
fDate :
19-20 May 2011
Firstpage :
92
Lastpage :
93
Abstract :
We report on the fabrication and characterization of flexible ZnO thin-film transistors (TFTs) using multilayer oxide buffer layers. ZnO-TFTs on polyethylene napthalate (PEN) substrates were fabricated by pulsed laser deposition (PLD) at room temperature (RT). ZnO films were characterized by Hall effect measurements. The electron mobility and the carrier density were 52.4 cm2/Vs and 3.2×1017 cm-3. Top-gate-type TFTs were fabricated from a thin film of HfO2 dielectric as a high-k material gate insulator. A transconductance, gm, of 1.7 mS/mm, an on/off-current ratio of 2.4×106 and a threshold voltage, Vth, of -1.2 V were achieved for a ZnO TFT with a SiO2/TiO2 buffer layer.
Keywords :
Hall effect; II-VI semiconductors; buffer layers; carrier density; electric current; electron mobility; flexible electronics; high-k dielectric thin films; pulsed laser deposition; semiconductor thin films; silicon compounds; substrates; thin film transistors; titanium compounds; zinc compounds; Hall effect measurement; HfO2; PEN substrate; SiO2-TiO2; ZnO; carrier density; dielectric; electron mobility; fabrication; flexible zinc oxide thin-film transistor; high-k material gate insulator; multilayer oxide buffer layer; on/off-current ratio; polyethylene napthalate substrate; pulsed laser deposition; room temperature; threshold voltage; top-gate-type TFT; transconductance; voltage -1.2 V; Films; Plastics; Substrates; Transconductance; Zinc oxide; Zinc oxide (ZnO); pulsed laser deposition (PLD); thin-film transistor(TFT);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Future of Electron Devices, Kansai, (IMFEDK), 2011 International Meeting for
Conference_Location :
Osaka
Print_ISBN :
978-1-61284-145-8
Electronic_ISBN :
978-1-61284-147-2
Type :
conf
DOI :
10.1109/IMFEDK.2011.5944860
Filename :
5944860
Link To Document :
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