DocumentCode
2117133
Title
An Effective Method to Extract Probability Distribution of Circuit Performance Modeled by Quadratic Response Surface Model
Author
Yang, Maofeng ; You, Hailong ; Jia, Xinzhang ; Wang, Dan
Author_Institution
Sch. of Microelectron., Xidian Univ., Xian
Volume
2
fYear
2008
fDate
20-22 Dec. 2008
Firstpage
600
Lastpage
603
Abstract
The significantly increased relative variations in integrated circuit process necessitate using quadratic response surface model to capture their nonlinear effect on circuit performance. However, the exact probability distribution of the circuit performance modeled by quadratic response surface model is unknown. This paper proposes a method to obtain the approximated probability distribution. We first develop the exact expression of the Continuous Time Fourier Transform of the unknown probability density function, and then apply frequency-domain sampling and Inverse Discrete Fourier Transform to obtain the approximated points of the unknown probability density function. Finally, spline functions are built to approximate the unknown probability density function and cumulative distribution function. An example of bandgap voltage reference circuit demonstrates that this method is more accurate and efficient than Monte Carlo simulation with 10000 samples. The algorithm can be incorporated into integrated circuit Computer Aided Design software for yield analysis and optimization.
Keywords
approximation theory; discrete Fourier transforms; frequency-domain analysis; integrated circuit modelling; inverse problems; response surface methodology; sampling methods; splines (mathematics); statistical distributions; circuit performance probability distribution; continuous time Fourier transform; cumulative distribution function; frequency-domain sampling; integrated circuit process; inverse discrete Fourier transform; nonlinear effect; probability density function; quadratic response surface model; spline function; Continuous Time Fourier Transform; Inverse Discrete Fourier Transform; probability distribution; process variation; quadratic response surface model; spline function;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Science and Engineering, 2008. ISISE '08. International Symposium on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-2727-4
Type
conf
DOI
10.1109/ISISE.2008.212
Filename
4732465
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