DocumentCode
2117228
Title
Boundary-dependent circuit model for the transient behavior of a thermal stack in power modules
Author
Cao, Xiao ; Lu, Guo-Quan ; Ngo, Khai
Author_Institution
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fYear
2011
fDate
17-22 Sept. 2011
Firstpage
1853
Lastpage
1860
Abstract
An accurate circuit model for transient behavior is necessary for transient thermal design and coupled electro-thermal simulation of complete power electronics system including semiconductor devices, thermal packages, and heat exchangers. Conventional thermal models of a power module are usually independent of boundary conditions, rendering these models ineffective in predicting the transient temperature of the thermal stacks as a function of heat-transfer coefficients. Thus, the paper presents an RC circuit model in which the thermal resistances and capacitances depend on the material properties and dimensions of the thermal layers, as well as the heat-transfer coefficient of the boundary. Only steady-state FEM simulation is needed to extract the model parameters. The boundary-dependent thermal model has been verified by simulation and experiment, which confirms that it is more accurate than the widely used thermal model based on assumption of 45° heat spreading.
Keywords
finite element analysis; modules; power electronics; thermal management (packaging); thermal resistance; transient analysis; RC circuit model; boundary-dependent circuit model; coupled electrothermal simulation; heat exchangers; heat-transfer coefficients; power electronics system; power modules; semiconductor devices; steady-state FEM simulation; thermal packages; thermal resistance; thermal stack; transient behavior; transient temperature prediction; transient thermal design; Equations; Heat transfer; Heating; Integrated circuit modeling; Mathematical model; Multichip modules; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Energy Conversion Congress and Exposition (ECCE), 2011 IEEE
Conference_Location
Phoenix, AZ
Print_ISBN
978-1-4577-0542-7
Type
conf
DOI
10.1109/ECCE.2011.6064011
Filename
6064011
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