DocumentCode :
2117545
Title :
An efficient resonant gate drive scheme for high frequency applications
Author :
Swamy, Mahesh ; Kume, Tsuneo J. ; Takada, Noriyuki
Author_Institution :
Yaskawa America Inc., Waukegan, IL, USA
fYear :
2011
fDate :
17-22 Sept. 2011
Firstpage :
1958
Lastpage :
1963
Abstract :
Gallium Nitride (GaN) and Silicon Carbide (SiC) devices have been found to withstand high voltages without showing degradation [1] and can be switched at high frequencies making them attractive for high power drives. Though GaN/SiC devices can be operated at high temperature and high frequencies, it is important to develop gate drive circuits to turn ON and OFF these devices efficiently at high speeds. This paper proposes a resonant gate drive circuit that aims at reducing the power loss associated with high frequency switching of power IGBT/MOSFETs. The proposed circuit is compared with traditional gate drive circuits from power consumption and switching speed points of view. Experimental results are given to illustrate the concept.
Keywords :
III-V semiconductors; field effect transistor switches; gallium compounds; power semiconductor switches; resonant invertors; silicon compounds; wide band gap semiconductors; GaN-SiC; IGBT; MOSFET; gate drive circuits; power consumption; resonant gate drive scheme; switching; Capacitance; Delay; Inductors; Insulated gate bipolar transistors; Logic gates; MOSFETs; RLC circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2011 IEEE
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4577-0542-7
Type :
conf
DOI :
10.1109/ECCE.2011.6064026
Filename :
6064026
Link To Document :
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