Title :
Thermal stability of Se/CdSe multilayers
Author :
Popescu, M. ; Sava, F. ; Lörinczi, A. ; Koch, P.-J. ; Gutberlet, T. ; Uebach, W. ; Bradaczek, H. ; Vateva, E. ; Nesheva, D.
Author_Institution :
Inst. of Phys. & Technol. of Mater., Bucharest, Romania
Abstract :
The structure and the thermal stability of amorphous Se/CdSe multilayers have been investigated by X-ray diffraction. The multilayers are stable up to 60°C. During thermal treatment firstly hexagonal selenium and then hexagonal CdSe phase are gradually separated
Keywords :
II-VI semiconductors; amorphous semiconductors; annealing; cadmium compounds; chemical interdiffusion; selenium; semiconductor heterojunctions; thermal stability; 60 degC; Se-CdSe; X-ray diffraction; amorphous Se/CdSe multilayers; semiconductors; structure; thermal stability; thermal treatment; Copper; Nonhomogeneous media; Tellurium; Thermal stability;
Conference_Titel :
Semiconductor Conference, 1996., International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-3223-7
DOI :
10.1109/SMICND.1996.557384
