• DocumentCode
    2117794
  • Title

    Thermal stability of Se/CdSe multilayers

  • Author

    Popescu, M. ; Sava, F. ; Lörinczi, A. ; Koch, P.-J. ; Gutberlet, T. ; Uebach, W. ; Bradaczek, H. ; Vateva, E. ; Nesheva, D.

  • Author_Institution
    Inst. of Phys. & Technol. of Mater., Bucharest, Romania
  • Volume
    1
  • fYear
    1996
  • fDate
    9-12 Oct 1996
  • Firstpage
    301
  • Abstract
    The structure and the thermal stability of amorphous Se/CdSe multilayers have been investigated by X-ray diffraction. The multilayers are stable up to 60°C. During thermal treatment firstly hexagonal selenium and then hexagonal CdSe phase are gradually separated
  • Keywords
    II-VI semiconductors; amorphous semiconductors; annealing; cadmium compounds; chemical interdiffusion; selenium; semiconductor heterojunctions; thermal stability; 60 degC; Se-CdSe; X-ray diffraction; amorphous Se/CdSe multilayers; semiconductors; structure; thermal stability; thermal treatment; Copper; Nonhomogeneous media; Tellurium; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 1996., International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-3223-7
  • Type

    conf

  • DOI
    10.1109/SMICND.1996.557384
  • Filename
    557384