• DocumentCode
    2118125
  • Title

    Multi-scale Conditional Random Fields for over-segmented irregular 3D point clouds classification

  • Author

    Lim, Ee Hui ; Suter, David

  • Author_Institution
    Inst. for Vision Syst. Eng., Monash Univ., Clayton, VIC
  • fYear
    2008
  • fDate
    23-28 June 2008
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    In this paper, we propose using multi-scale Conditional Random Fields to classes 3D outdoor terrestrial laser scanned data. We improved Lim and Suterpsilas methods by introducing regional edge potentials in addition to the local edge and node potentials in the multi-scale Conditional Random Fields, and only a relatively small amount of increment in the computation time is required to achieve the improved recognition rate. In the model, the raw data points are over-segmented into an improved mid-level representation, ldquosuper-voxelsrdquo. Local and regional features are then extracted from the super-voxel and parameters learnt by the multi-scale Conditional Random Fields. The classification accuracy is improved by 5% to 10% with our proposed model compared to labeling with Conditional Random Fields in (Lim and Suter, 2007). The overall computation time by labeling the super-voxels instead of individual points is lower than the previous 3D data labeling approaches.
  • Keywords
    feature extraction; image classification; image representation; image segmentation; optical radar; optical scanners; radar computing; radar imaging; solid modelling; 3D LIDAR data; 3D outdoor terrestrial laser scanned data; graphical model; local feature extraction; mid-level representation; multiscale conditional random fields; over-segmented irregular 3D point cloud classification; regional feature extraction; super-voxels; Clouds; Data engineering; Data mining; Feature extraction; Graphical models; Labeling; Laser modes; Laser radar; Machine vision; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops, 2008. CVPRW '08. IEEE Computer Society Conference on
  • Conference_Location
    Anchorage, AK
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-2339-2
  • Electronic_ISBN
    2160-7508
  • Type

    conf

  • DOI
    10.1109/CVPRW.2008.4563064
  • Filename
    4563064