DocumentCode :
2118182
Title :
Efficient simulation of the effect of random metrology errors on a sparse aperture system
Author :
Tasker, Frederick ; Plourde, Bert ; Palecki, Lou ; Reed, Anne
Author_Institution :
Assurance Technology
Volume :
4
fYear :
2003
fDate :
March 8-15, 2003
Keywords :
Apertures; Error analysis; Error correction; Fast Fourier transforms; Frequency; Metrology; Optical control; Optical feedback; Optical imaging; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace Conference, 2003. Proceedings. 2003 IEEE
ISSN :
1095-323X
Print_ISBN :
0-7803-7651-X
Type :
conf
DOI :
10.1109/AERO.2003.1235108
Filename :
1235108
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2118182
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