• DocumentCode
    2118993
  • Title

    Precise Time Synchronization in Semiconductor Manufacturing

  • Author

    Anandarajah, V. ; Kalappa, N. ; Sangole, R. ; Hussaini, S. ; Ya-Shian Li ; Baboud, J. ; Moyne, J.

  • Author_Institution
    Michigan Univ., Ann Arbor
  • fYear
    2007
  • fDate
    1-3 Oct. 2007
  • Firstpage
    78
  • Lastpage
    84
  • Abstract
    In today\´s semiconductor fabrication facilities ("fabs"), coordination of time-based information throughout the factory and enterprise has become necessary to support fab-wide diagnostics, control, and information management. This has driven the need to have time synchronization at all levels of the enterprise. Time synchronization protocols such as network time protocol (NTP) and precision time protocol (PTP) have been defined for performing synchronization over distributed systems. Lack of time synchronization among the various subsystems is seen as a factor of poor data quality in equipment data acquisition (EDA) and advanced process control (A PC) analysis. The focus of our study is to investigate the extent and precision of time synchronization that can be practically applied with the available protocols at various levels of the semiconductor factory environment to meet next generation manufacturing requirements. To this end, we describe the objectives, details, and implementation of the simulator that aims to model a semiconductor factory network This will provide a practical perspective to study the accuracy achievable and potential network factors contributing to accuracy degradation of factory-wide time synchronization.
  • Keywords
    data acquisition; semiconductor device manufacture; synchronisation; advanced process control analysis; equipment data acquisition; network time protocol; precise time synchronization; precision time protocol; semiconductor fabrication facilities; semiconductor manufacturing; synchronization protocols; Data acquisition; Degradation; Electronic design automation and methodology; Fabrication; Information management; Process control; Production facilities; Protocols; Semiconductor device manufacture; Synchronization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Clock Synchronization for Measurement, Control and Communication, 2007. ISPCS 2007. IEEE International Symposium on
  • Conference_Location
    Vienna
  • Print_ISBN
    978-1-4244-1063-7
  • Type

    conf

  • DOI
    10.1109/ISPCS.2007.4383777
  • Filename
    4383777