DocumentCode
2119146
Title
Two novel surface model based inversion algorithms using multi-frequency polSAR data
Author
Allain, S. ; Ferro-Famil, L. ; Pottier, E.
Author_Institution
Image & Remote Sensing Group, Rennes I Univ.
Volume
2
fYear
2004
fDate
20-24 Sept. 2004
Firstpage
823
Lastpage
826
Abstract
The aim of this paper is to present two novel surface model based inversion algorithms using multifrequency and polSAR data. The first part of this work introduces a polarimetric scattering model using the integral equation model (IEM) with a transition model for the reflection coefficient. Polarimetric descriptors: the entropy (H), the anisotropy (A), and the mean alpha angle obtained from the Cloude/Pottier polarimetric decomposition theorem are employed for surface characterization. A new polarimetric parameter: the eigenvalue relative difference (ERD) is developed to overcome the anisotropy limitations in case of rough surfaces. Built on relevant polarimetric descriptors: H, alpha1 and ERD, two novel surface model based inversion algorithms using multifrequency polSAR data are presented. The first algorithm is built up in a "low frequency" (P to S band) - "high frequency" (C to K band) scheme. This algorithm retrieves the soil parameters by using multifrequency least-square fit
Keywords
eigenvalues and eigenfunctions; geophysical techniques; integral equations; inverse problems; least squares approximations; radar polarimetry; remote sensing; soil; synthetic aperture radar; Cloude/Pottier polarimetric decomposition theorem; ERD; IEM; anisotropy; anisotropy limitation; eigenvalue relative difference; entropy; integral equation model; multifrequency least-square fit; multifrequency polSAR data; polarimetric descriptor; polarimetric scattering model; reflection coefficient; rough surfaces; soil parameters; surface characterization; surface model based inversion algorithm; transition model; Anisotropic magnetoresistance; Eigenvalues and eigenfunctions; Entropy; Frequency; Integral equations; Reflection; Rough surfaces; Scattering; Surface fitting; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 2004. IGARSS '04. Proceedings. 2004 IEEE International
Conference_Location
Anchorage, AK
Print_ISBN
0-7803-8742-2
Type
conf
DOI
10.1109/IGARSS.2004.1368531
Filename
1368531
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