DocumentCode :
2119146
Title :
Two novel surface model based inversion algorithms using multi-frequency polSAR data
Author :
Allain, S. ; Ferro-Famil, L. ; Pottier, E.
Author_Institution :
Image & Remote Sensing Group, Rennes I Univ.
Volume :
2
fYear :
2004
fDate :
20-24 Sept. 2004
Firstpage :
823
Lastpage :
826
Abstract :
The aim of this paper is to present two novel surface model based inversion algorithms using multifrequency and polSAR data. The first part of this work introduces a polarimetric scattering model using the integral equation model (IEM) with a transition model for the reflection coefficient. Polarimetric descriptors: the entropy (H), the anisotropy (A), and the mean alpha angle obtained from the Cloude/Pottier polarimetric decomposition theorem are employed for surface characterization. A new polarimetric parameter: the eigenvalue relative difference (ERD) is developed to overcome the anisotropy limitations in case of rough surfaces. Built on relevant polarimetric descriptors: H, alpha1 and ERD, two novel surface model based inversion algorithms using multifrequency polSAR data are presented. The first algorithm is built up in a "low frequency" (P to S band) - "high frequency" (C to K band) scheme. This algorithm retrieves the soil parameters by using multifrequency least-square fit
Keywords :
eigenvalues and eigenfunctions; geophysical techniques; integral equations; inverse problems; least squares approximations; radar polarimetry; remote sensing; soil; synthetic aperture radar; Cloude/Pottier polarimetric decomposition theorem; ERD; IEM; anisotropy; anisotropy limitation; eigenvalue relative difference; entropy; integral equation model; multifrequency least-square fit; multifrequency polSAR data; polarimetric descriptor; polarimetric scattering model; reflection coefficient; rough surfaces; soil parameters; surface characterization; surface model based inversion algorithm; transition model; Anisotropic magnetoresistance; Eigenvalues and eigenfunctions; Entropy; Frequency; Integral equations; Reflection; Rough surfaces; Scattering; Surface fitting; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2004. IGARSS '04. Proceedings. 2004 IEEE International
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-8742-2
Type :
conf
DOI :
10.1109/IGARSS.2004.1368531
Filename :
1368531
Link To Document :
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