• DocumentCode
    2119146
  • Title

    Two novel surface model based inversion algorithms using multi-frequency polSAR data

  • Author

    Allain, S. ; Ferro-Famil, L. ; Pottier, E.

  • Author_Institution
    Image & Remote Sensing Group, Rennes I Univ.
  • Volume
    2
  • fYear
    2004
  • fDate
    20-24 Sept. 2004
  • Firstpage
    823
  • Lastpage
    826
  • Abstract
    The aim of this paper is to present two novel surface model based inversion algorithms using multifrequency and polSAR data. The first part of this work introduces a polarimetric scattering model using the integral equation model (IEM) with a transition model for the reflection coefficient. Polarimetric descriptors: the entropy (H), the anisotropy (A), and the mean alpha angle obtained from the Cloude/Pottier polarimetric decomposition theorem are employed for surface characterization. A new polarimetric parameter: the eigenvalue relative difference (ERD) is developed to overcome the anisotropy limitations in case of rough surfaces. Built on relevant polarimetric descriptors: H, alpha1 and ERD, two novel surface model based inversion algorithms using multifrequency polSAR data are presented. The first algorithm is built up in a "low frequency" (P to S band) - "high frequency" (C to K band) scheme. This algorithm retrieves the soil parameters by using multifrequency least-square fit
  • Keywords
    eigenvalues and eigenfunctions; geophysical techniques; integral equations; inverse problems; least squares approximations; radar polarimetry; remote sensing; soil; synthetic aperture radar; Cloude/Pottier polarimetric decomposition theorem; ERD; IEM; anisotropy; anisotropy limitation; eigenvalue relative difference; entropy; integral equation model; multifrequency least-square fit; multifrequency polSAR data; polarimetric descriptor; polarimetric scattering model; reflection coefficient; rough surfaces; soil parameters; surface characterization; surface model based inversion algorithm; transition model; Anisotropic magnetoresistance; Eigenvalues and eigenfunctions; Entropy; Frequency; Integral equations; Reflection; Rough surfaces; Scattering; Surface fitting; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2004. IGARSS '04. Proceedings. 2004 IEEE International
  • Conference_Location
    Anchorage, AK
  • Print_ISBN
    0-7803-8742-2
  • Type

    conf

  • DOI
    10.1109/IGARSS.2004.1368531
  • Filename
    1368531