• DocumentCode
    2119206
  • Title

    A new approach for iris segmentation

  • Author

    Zuo, Jinyu ; Ratha, Nalini K. ; Connell, Jonathan H.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Hawthorne, NY
  • fYear
    2008
  • fDate
    23-28 June 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Iris segmentation is an important first step for high accuracy iris recognition. A robust iris segmentation procedure should be able to handle noise, occlusion and non-uniform lighting. It also impacts system accuracy - high FAR or FRR values may come directly from bad or wrong segmentations. In this paper a simple new approach for iris segmentation is proposed that tries to integrate quality evaluation ideas directly into the segmentation algorithm. By cutting out all the bad areas, the fraction of the iris that remains can be used as a comprehensive quality measure. This eliminates images with high occlusion (e.g. by the eyelids) as well as images with other quality problems (e.g. low contrast), all using the same mechanism. The proposed method has been tested on a medium-sized (450 image) public database (MMU1) and the score distribution investigated. We also show that, as expected, overall matching accuracy can be improved by rejecting images which have a low quality assessment, thus validating the utility of this measure.
  • Keywords
    biometrics (access control); eye; image matching; image segmentation; image matching; image quality; iris segmentation; Acoustic reflection; Area measurement; Eyelashes; Eyelids; Image databases; Image quality; Image segmentation; Iris recognition; Noise robustness; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops, 2008. CVPRW '08. IEEE Computer Society Conference on
  • Conference_Location
    Anchorage, AK
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-2339-2
  • Electronic_ISBN
    2160-7508
  • Type

    conf

  • DOI
    10.1109/CVPRW.2008.4563109
  • Filename
    4563109