DocumentCode :
2119248
Title :
Feature transformation of biometric templates for secure biometric systems based on error correcting codes
Author :
Sutcu, Yagiz ; Rane, Shantanu ; Yedidia, Jonathan S. ; Draper, Stark C. ; Vetro, Anthony
Author_Institution :
Polytech. Univ., Brooklyn, NY
fYear :
2008
fDate :
23-28 June 2008
Firstpage :
1
Lastpage :
6
Abstract :
Secure storage of biometric templates is extremely important because a compromised biometric cannot be revoked and replaced an unlimited number of times. In many approaches proposed for secure biometric storage, an error correcting code (ECC) is applied to the enrollment biometric and the resulting parity or syndrome symbols are stored on the access control device, instead of the original biometric. The principal challenge here is that most standard ECCs are designed for memoryless channel statistics, whereas the variations between enrollment and probe biometrics have significant spatial correlation. To address this challenge, we propose to transform the original biometric into a feature vector that is explicitly matched to standard ECCs, thereby improving the security-robustness tradeoff of the overall biometric system. As a concrete example, we transform fingerprint minutiae maps into feature vectors compatible with ECCs designed for a binary symmetric channel. We conduct a statistical analysis of these feature vectors and show how our feature transformation algorithm may be combined with Low-Density Parity Check (LDPC) codes to obtain a secure fingerprint biometric system.
Keywords :
biometrics (access control); error correction codes; statistical analysis; telecommunication security; binary symmetric channel; biometric template; error correcting codes; feature transformation; memoryless channel statistics; secure biometric system; Access control; Biometrics; Concrete; Error correction codes; Fingerprint recognition; Memoryless systems; Parity check codes; Probes; Secure storage; Statistics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition Workshops, 2008. CVPRW '08. IEEE Computer Society Conference on
Conference_Location :
Anchorage, AK
ISSN :
2160-7508
Print_ISBN :
978-1-4244-2339-2
Electronic_ISBN :
2160-7508
Type :
conf
DOI :
10.1109/CVPRW.2008.4563111
Filename :
4563111
Link To Document :
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