Title :
Microwave noise of hot electrons in AlxGal-xAs channel. Procedure for measuring AlGaAs lattice heating
Author :
de Murcia, M. ; Richard, E. ; Benvenuti, A. ; Vanbremeersch, J. ; Zimmermann, J.
Author_Institution :
C.E.M., -U.R.A. CNRS 391, Université de Montpellier II. 34095 Montpellier Cedex 5, France.
Abstract :
Hot electron noise temperatures using a pulsed measurement technique as finction of electric field in the frequency range 5OMHz-4GHz are presented in Si doped AIxGaIxAs alloy with 0.15, 0.2, 0.25 and 0.3 aluminium contents x. Diffusion coefficients D(E) are deduced. A method to detect self heating effects of devices under test has been developed.
Keywords :
Aluminum alloys; Automatic testing; Electromagnetic heating; Electrons; Frequency; Lattices; Measurement techniques; Pulse measurements; Silicon alloys; Temperature distribution;
Conference_Titel :
Microwave Conference, 1994. 24th European
Conference_Location :
Cannes, France
DOI :
10.1109/EUMA.1994.337304
