Title :
Wide bandwidth system identification of AC system impedances by applying pertubations to an existing converter
Author :
Martin, Daniel ; Santi, Enrico ; Barkley, Adam
Author_Institution :
Dept. of Electr. Eng., Univ. of South Carolina, Columbia, SC, USA
Abstract :
A new approach is developed using an existing single-phase power electronics inverter to make a wideband impedance measurement at its interface using a pseudo-random binary sequence (PRBS) voltage perturbation and digital network analyzer techniques. Since the PRBS is an approximation to white noise, all frequencies of interest can be excited simultaneously. The perturbation at the interface is measured and cross-correlation techniques are applied to construct the wideband impedance of the system under test. Online monitoring of interface impedances is a key enabler for a number of smart-grid related capabilities, such as grid health monitoring, active filter re-tuning, identifying system interaction, and adaptive control of grid-connected switching converters. Knowledge of the converter´s surroundings enables smarter control actions, which lead to improved stability, performance and reliability of the smart grid.
Keywords :
binary sequences; electric impedance measurement; power system measurement; random sequences; smart power grids; AC system impedances; PRBS voltage perturbation; active filter retuning; adaptive control; cross-correlation techniques; digital network analyzer techniques; grid health monitoring; grid-connected switching converters; interface impedances; online monitoring; pseudorandom binary sequence; single-phase power electronic inverter; smart control; smart grid performance; smart grid reliability; smart grid stability; smart-grid related capabilities; system interaction identification; wide-bandwidth system identification; wideband impedance measurement; Correlation; Frequency measurement; Impedance; Impedance measurement; Inverters; Noise; Voltage measurement;
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2011 IEEE
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4577-0542-7
DOI :
10.1109/ECCE.2011.6064108