Title :
RF breakdown test of SiO2 coated copper electrodes
Author :
Sun, D. ; Datte, P. ; MacKay, W.W. ; Huson, F.R.
Author_Institution :
Texas Accel. Center, The Woodlands, TX, USA
Abstract :
RF breakdown test results with copper and SiO/sub 2/-coated copper are presented. The interest was to investigate what improvement could be made in depressing the field emission and increasing the maximum field gradient by the SiO/sub 2/ coating. The results show that the breakdown started at a field level of 97-100 MV/m with the SiO/sub 2/-coated electrodes. The Kilpatrick limit at 471 MHz is 20 MV/m. This means that SiO/sub 2/ coating may provide a method for keeping the electrode surface free of damage during high field gradient operation. The SiO/sub 2/ coating can also reduce the field emission. Compared with the pure copper electrodes which were used for more than 100 h, the data show that the total normalized X-ray counts of the pure copper sample were about 20 times more than that of SiO/sub 2/-coated copper.<>
Keywords :
copper; electric breakdown of solids; electrodes; electron field emission; silicon compounds; 471 MHz; Kilpatrick limit; RF breakdown test; SiO/sub 2/-Cu; electrode surface; field emission; high field gradient operation; maximum field gradient; normalized X-ray counts; Copper; Electric breakdown; Electrodes; Electron emission; Monitoring; Radio frequency; Sparks; Spectroscopy; Testing; Voltage;
Conference_Titel :
Particle Accelerator Conference, 1991. Accelerator Science and Technology., Conference Record of the 1991 IEEE
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-0135-8
DOI :
10.1109/PAC.1991.164424
