DocumentCode :
2120058
Title :
Quantitative analysis and decoupling of mass and stiffness effects in cantilever mass sensors
Author :
Sadeghian, Hamed ; Goosen, Johannes F L ; Van Keulen, Fred ; Yang, Chung-Kai ; Bossche, Andre ; French, Paddy J.
Author_Institution :
Dept. of Precision & Microsyst. Eng., Tech. Univ. Delft, Delft, Netherlands
fYear :
2010
fDate :
1-4 Nov. 2010
Firstpage :
631
Lastpage :
634
Abstract :
Response of nanomechanical resonant mass sensors to adsorption does not only depend on the mass loading, but also on the adsorbate stiffness, adsorption induced surface stresses and location. It is therefore clear that with just resonance frequency measurement, decoupling the stiffness and the mass effects is difficult. A recent theory proposed using the electrostatic pull-in instability (EPI), in combination with the resonance frequency to decouple the aforementioned opposing effects, is presented hereof. In this paper, by performing experiments of adsorption on cantilevers, we 1) performed preliminary experiments on EPI stiffness measurement and show the stiffness effects of typical mass deposition, 2) show that EPI can be used in combination with the frequency measurements, to quantitatively analyze both the stiffness and the mass of the adsorbed material.
Keywords :
adsorption; cantilevers; elastic constants; frequency measurement; mass measurement; mechanical variables measurement; nanosensors; stability; EPI stiffness measurement; adsorbate stiffness; adsorption induced surface stress; cantilever mass sensor; electrostatic pull-in instability; mass decoupling; nanomechanical resonant mass sensor; resonance frequency measurement; stiffness decoupling effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
ISSN :
1930-0395
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2010.5690114
Filename :
5690114
Link To Document :
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