• DocumentCode
    2120092
  • Title

    Advancing the manufacturing of CdTe modules

  • Author

    Walters, K ; Kobyakov, PS ; Sakurai, H ; Sampath, WS

  • Author_Institution
    Materials Engineering Laboratory, NSF I/UCRC for Next Generation Photovoltaics, Colorado State University, Fort Collins, USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    An overview of some of the research in our laboratories to advance the manufacturing of CdTe modules is discussed. These include collaborative efforts with PPG Industries to develop an advanced glass product for CdTe modules with a low soiling anti-reflective (LSAR) coating, transparent conducting oxide (TCO) with improved transmission and high resistive buffer layers. The aim is to develop these coatings such that they can be manufactured with existing production methods in the glass industry. These substrates are being processed into devices utilizing research systems that simulate industrial processes. In order to improve the manufacturing of the semiconductor films for CdTe modules, a computer system (hardware and software) utilizing computational fluid dynamics (CFD) modeling has been developed. This system has been successfully used to model the thermal and flow characteristics of industrial manufacturing systems. The prediction of the CFD models and actual measurements are within 2.5% or less. The use of plasma and co-sublimation to improve the CdTe modules are part of other presentations at this conference. The viability of a simple XRF system for in-line thickness measurements for quality control has been demonstrated.
  • Keywords
    Computational fluid dynamics; Computational modeling; Films; Heating; Manufacturing; Semiconductor device measurement; Thickness measurement; CdTe; manufacturing; modules;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), Volume 2, 2012 IEEE 38th
  • Conference_Location
    Austin, TX, USA
  • Type

    conf

  • DOI
    10.1109/PVSC-Vol2.2012.6656711
  • Filename
    6656711