• DocumentCode
    2120362
  • Title

    Analog circuit design in scaled CMOS technology

  • Author

    Sansen, W.

  • Author_Institution
    Katholieke Univ., Leuven, Belgium
  • fYear
    1996
  • fDate
    13-15 June 1996
  • Firstpage
    8
  • Lastpage
    11
  • Abstract
    Scaled CMOS technology gives rise to submicron devices. In such devices short-channel effects lead to shifts in threshold voltage, increased mismatch and noise. The velocity saturation limits the obtainable transconductance and hence also the high speed performance. Lower supply voltages require the operational amplifier building block to operate rail-to-rail. In delta-sigma converters this leads to very-low-power converters. Considerable attention goes to circuit design for telecommunication applications, in which the inductor is making a comeback. The ultimate challenge of analog design however is the cointegration with digital blocks, causing coupling noise and requiring sophisticated tools.
  • Keywords
    CMOS analogue integrated circuits; VLSI; integrated circuit design; integrated circuit noise; operational amplifiers; sigma-delta modulation; analog circuit design; circuit design; coupling noise; delta-sigma converters; high speed performance; operational amplifier building block; scaled CMOS technology; short-channel effects; submicron devices; supply voltages; threshold voltage; transconductance; velocity saturation; Analog circuits; CMOS analog integrated circuits; CMOS technology; Circuit noise; Circuit synthesis; Operational amplifiers; Rail to rail amplifiers; Rail to rail operation; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 1996. Digest of Technical Papers., 1996 Symposium on
  • Conference_Location
    Honolulu, HI, USA
  • Print_ISBN
    0-7803-3339-X
  • Type

    conf

  • DOI
    10.1109/VLSIC.1996.507696
  • Filename
    507696