DocumentCode :
2120865
Title :
Silicon Laser Annealing by a Two-Pulse Laser System with Variable Pulse Offsets
Author :
Gonda, V. ; Slabbekoorn, J. ; Nanver, L.K.
Author_Institution :
Delft Univ. of Technol., Delft
fYear :
2007
fDate :
2-5 Oct. 2007
Firstpage :
257
Lastpage :
261
Abstract :
Double-pulsed high-power excimer laser annealing is investigated for use as a means of implanted dopant activation. The laser setup incorporates two lasers that allow double pulse laser annealing with pulse offsets much smaller than the repetition of the individual XeCl excimer lasers. In this configuration, the pulse offset can be fine tuned. Sheet resistances are measured and thermal simulations are conducted to study temperature profiles. Results show, that the total laser energy needed for a complete activation increases with the pulse separation. The increase can be compensated by substrate heating. In this way the thermal budget can be tuned with more freedom.
Keywords :
elemental semiconductors; laser beam annealing; semiconductor doping; sheet materials; silicon; Si:As; Si:As - Binary; excimer laser annealing; implanted dopant activation; sheet resistances; substrate heating; temperature profiles; thermal simulations; total laser energy; two-pulse laser system; variable pulse offsets; Annealing; Electrical resistance measurement; Laser modes; Laser tuning; Optical pulse generation; Optical pulses; Semiconductor lasers; Silicon; Solid lasers; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Thermal Processing of Semiconductors, 2007. RTP 2007. 15th International Conference on
Conference_Location :
Catania, Sicily
Print_ISBN :
978-1-4244-1228-0
Electronic_ISBN :
978-1-4244-1228-0
Type :
conf
DOI :
10.1109/RTP.2007.4383851
Filename :
4383851
Link To Document :
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