Title :
Object wavefunction reconstruction in high resolution electron microscopy
Author :
Dyck, D. Van ; De Beeck, M. Op ; Coene, W.
Author_Institution :
Antwerp Univ., Belgium
Abstract :
A new approach is proposed to retrieve the wavefunction at the exit face of an object by capturing images at a series of closely spaced focus values and to process the whole 3D data. This technique is optimised for high resolution transmission electron microscopy and applied to experimentally obtained defocus series
Keywords :
electron microscopy; image reconstruction; physics computing; transmission electron microscopy; wave functions; 3D data; closely spaced focus values; defocus series; exit face; high resolution electron microscopy; object wavefunction reconstruction; Electron emission; Electron microscopy; Focusing; Image processing; Image reconstruction; Image resolution; Image retrieval; Information retrieval; Laboratories; Transmission electron microscopy;
Conference_Titel :
Image Processing, 1994. Proceedings. ICIP-94., IEEE International Conference
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-6952-7
DOI :
10.1109/ICIP.1994.413840
