Title :
New Insights In Optimizing CMOS Inverter Circuits With Respect To Hot-carrier Degradation
Author_Institution :
Hitachi, Ltd.
Keywords :
Circuit simulation; Degradation; Design optimization; Hot carriers; Inverters; Laboratories; MOSFET circuits; Power MOSFET; Power supplies; Threshold voltage;
Conference_Titel :
VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
Print_ISBN :
0-7803-1338-0
DOI :
10.1109/VPAD.1993.724766
