DocumentCode
2121096
Title
New Insights In Optimizing CMOS Inverter Circuits With Respect To Hot-carrier Degradation
Author
Lee, Peter M.
Author_Institution
Hitachi, Ltd.
fYear
1993
fDate
14-15 May 1993
Firstpage
154
Lastpage
155
Keywords
Circuit simulation; Degradation; Design optimization; Hot carriers; Inverters; Laboratories; MOSFET circuits; Power MOSFET; Power supplies; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
Print_ISBN
0-7803-1338-0
Type
conf
DOI
10.1109/VPAD.1993.724766
Filename
724766
Link To Document