DocumentCode

2121227

Title

Energy Broadening Associated With Finite Collision Duration In Hot Carrier Transport In Semiconductors

Author

Sano, Nobuyuki

Author_Institution

NTT LSI Laboratories

fYear

1993

fDate

14-15 May 1993

Firstpage

162

Lastpage

165

Keywords

Approximation methods; Electrons; Equations; Fabrication; Hot carriers; Kinetic theory; Laboratories; Large scale integration; Phonons; Scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on

Print_ISBN

0-7803-1338-0

Type

conf

DOI

10.1109/VPAD.1993.724770

Filename

724770