• DocumentCode
    2121252
  • Title

    A Simple Hot Electron Transport Model And Its Prediction Of Si-SiO2 Injection Probability

  • Author

    Jin, Gyo-young ; Park, Young-June ; Min, Hong-Shick

  • Author_Institution
    Seoul Nat. Univ.
  • fYear
    1993
  • fDate
    14-15 May 1993
  • Firstpage
    166
  • Lastpage
    167
  • Keywords
    Electromagnetic scattering; Electron emission; Electron mobility; Impact ionization; Network address translation; Particle scattering; Phonons; Predictive models; Probability; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
  • Print_ISBN
    0-7803-1338-0
  • Type

    conf

  • DOI
    10.1109/VPAD.1993.724771
  • Filename
    724771
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2121252