DocumentCode :
2121299
Title :
Influence Of Energy Transport Related Effects On NPN BJT Device Performance And ECL Gate Delay Analyzed By 2D Parallel Mixed Level Device/circuit Simulation
Author :
Stecher, M. ; Meinerzhagen, B. ; Bork, I. ; Krucken, J.M.J. ; Maas, P. ; Engl, W.L.
Author_Institution :
University of Aachen
fYear :
1993
fDate :
14-15 May 1993
Firstpage :
170
Lastpage :
171
Keywords :
Analytical models; Circuit simulation; Delay effects; Distributed decision making; Electrons; High definition video; Hydrodynamics; Performance analysis; Space charge; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
Print_ISBN :
0-7803-1338-0
Type :
conf
DOI :
10.1109/VPAD.1993.724773
Filename :
724773
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2121299
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