DocumentCode
2121350
Title
Elimination of artifacts in external quantum efficiency measurements for multijunction solar cells using a pulsed light bias
Author
Li, Jing-Jing ; Zhang, Yong-Hang
Author_Institution
Center for Photonics Innovation and School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, 85287 USA
fYear
2012
fDate
3-8 June 2012
Firstpage
1
Lastpage
6
Abstract
A method using a pulsed light bias synchronized to the probing monochromatic light and superimposed on the conventional dc light and voltage biases is proposed to eliminate the artifacts in external quantum efficiency (EQE) measurements for multijunction solar cells. It is demonstrated experimentally that this method effectively eliminates the EQE measurement artifacts caused by the shunt effect, the luminescence coupling effect, or their combination.
Keywords
Couplings; Current measurement; Indium gallium arsenide; Luminescence; Photoconductivity; Photovoltaic cells; Wavelength measurement; External quantum efficiency; luminescence coupling; measurement artifacts; multijunction solar cell; pulsed light bias; shunt;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), Volume 2, 2012 IEEE 38th
Conference_Location
Austin, TX, USA
Type
conf
DOI
10.1109/PVSC-Vol2.2012.6656755
Filename
6656755
Link To Document