• DocumentCode
    2121391
  • Title

    Electrical characterization of Cu composition effects in CdS/CdTe thin-film solar cells with a ZnTe:Cu back contact

  • Author

    Li, Jian V. ; Duenow, Joel N. ; Kuciauskas, Darius ; Kanevce, Ana ; Dhere, Ramesh G. ; Young, Matthew R. ; Levi, Dean H.

  • Author_Institution
    National Renewable Energy Laboratory, 15013 Denver West Parkway, Golden, Colorado 80401 USA
  • fYear
    2012
  • fDate
    3-8 June 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    We study the effects of Cu composition on the CdTe/ZnTe:Cu back contact and the bulk CdTe. For the back contact, its potential barrier decreases with Cu concentration while its saturation current density increases. For the bulk CdTe, the hole density increases with Cu concentration. We identify a Cu-related deep level at ∼0.55 eV whose concentration is significant when the Cu concentration is high. The device performance, which initially improves with Cu concentration then decreases, reflects the interplay between the positive influences (reducing the back contact potential barrier while increasing the saturation current density of the back contact and hole density in CdTe bulk) and negative influences (increasing deep levels in CdTe) of Cu.
  • Keywords
    Admittance; Cadmium; Gold; Lead; Optical films; Performance evaluation; Switches; CdTe; admittance measurement; capacitance-voltage characteristics; charge carrier density; contacts; defect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), Volume 2, 2012 IEEE 38th
  • Conference_Location
    Austin, TX, USA
  • Type

    conf

  • DOI
    10.1109/PVSC-Vol2.2012.6656756
  • Filename
    6656756