DocumentCode :
2121391
Title :
Electrical characterization of Cu composition effects in CdS/CdTe thin-film solar cells with a ZnTe:Cu back contact
Author :
Li, Jian V. ; Duenow, Joel N. ; Kuciauskas, Darius ; Kanevce, Ana ; Dhere, Ramesh G. ; Young, Matthew R. ; Levi, Dean H.
Author_Institution :
National Renewable Energy Laboratory, 15013 Denver West Parkway, Golden, Colorado 80401 USA
fYear :
2012
fDate :
3-8 June 2012
Firstpage :
1
Lastpage :
5
Abstract :
We study the effects of Cu composition on the CdTe/ZnTe:Cu back contact and the bulk CdTe. For the back contact, its potential barrier decreases with Cu concentration while its saturation current density increases. For the bulk CdTe, the hole density increases with Cu concentration. We identify a Cu-related deep level at ∼0.55 eV whose concentration is significant when the Cu concentration is high. The device performance, which initially improves with Cu concentration then decreases, reflects the interplay between the positive influences (reducing the back contact potential barrier while increasing the saturation current density of the back contact and hole density in CdTe bulk) and negative influences (increasing deep levels in CdTe) of Cu.
Keywords :
Admittance; Cadmium; Gold; Lead; Optical films; Performance evaluation; Switches; CdTe; admittance measurement; capacitance-voltage characteristics; charge carrier density; contacts; defect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), Volume 2, 2012 IEEE 38th
Conference_Location :
Austin, TX, USA
Type :
conf
DOI :
10.1109/PVSC-Vol2.2012.6656756
Filename :
6656756
Link To Document :
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