Title :
A microsystem for high resolution measurement of cell forces
Author :
Vázquez, Javier ; Hedley, John ; Birch, Mark ; Redfern, Chris
Author_Institution :
ETS Ing. Ind., Univ. de Castilla-La Mancha, Ciudad Real, Spain
Abstract :
A variety of methods are available for monitoring of cell forces. Here we report on a novel approach utilising optical profilometry within a liquid to measure in-plane displacements induced by cells as they are cultured in a microsystem. The high resolution obtainable from profilometry gives an order of magnitude improvement in measurement resolution compared to conventional optical techniques, a repeatability of 4nm being achieved in this work. The methodology is developed to give no restriction to the cell environment, thereby allowing the potential for a broad range of experiments in the field.
Keywords :
biomechanics; biomedical measurement; cellular biophysics; displacement measurement; micromechanical devices; cell forces; in-plane displacements; measurement resolution; microsystem; optical profilometry;
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2010.5690165