DocumentCode :
2121517
Title :
Linear independent increment process with linear standard deviation function for degradation analysis
Author :
Zhihua Wang ; Huimin Fu ; Yongbo Zhang
Author_Institution :
Res. Center of Small Sample Technol., Beihang Univ., Beijing, China
fYear :
2013
fDate :
15-19 Jan. 2013
Firstpage :
94
Lastpage :
98
Abstract :
Degradation test is a feasible means to assess the failure time distributions of complex systems and highly reliable products. Generally speaking, the degradation process is essentially a continuous state random process. Motivated by the independent increment process theory, we propose a degradation analysis model, in which degradation is represented by an independent increment process with linear mean and standard deviation functions (quadratic variance function). A one-stage method is further developed to estimate the model parameters and failure time distribution. The methodology has been implemented in the analysis of GaAs laser degradation. The comparative results illustrate that the proposed method can be considered good and show a promise for future applications.
Keywords :
random processes; reliability theory; statistical analysis; complex system; continuous state random process; degradation analysis model; degradation process; degradation test; failure time distribution; laser degradation; linear independent increment process theory; linear mean deviation function; linear standard deviation function; model parameter; quadratic variance function; reliable product; Degradation; Reliability; Degradation modeling; Failure time distribution; Life prediction; Linear independent increment process; Reliability assessment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Sciences and Technology (IBCAST), 2013 10th International Bhurban Conference on
Conference_Location :
Islamabad
Print_ISBN :
978-1-4673-4425-8
Type :
conf
DOI :
10.1109/IBCAST.2013.6512137
Filename :
6512137
Link To Document :
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